Platform topic

Data handling & data management

Every part has its story.

What is this about?

Test data turns into insight.

Seamless data capture creates transparency – and better decisions. SonicTC delivers the foundation for statistical process control (Cp, Cpk), Pareto, defect and correlation analyses directly from the test software.

A central data platform links engineering, production and sites. Findings from the line flow back into design – and vice versa.

SonicTC role-based access control (RBAC) with users, roles and permissions
Benefits

What you get.

The SonicTC history is the central test object and measurement data store. It links installations, archives audit-proof, and provides data for statistics, analyses and reports.

Central history

Test parts, results and metadata land audit-proof in a modern SQL database.

Audit trail & compliance

Seamless change history – meets the audit trail requirements of FDA 21 CFR Part 11, IEC 62304 and ISO 13485.

Role-based access

Operator, setter, engineer, QM, admin – everyone sees only what they need. Active-Directory-ready.

Identification & backup

Auto-ID via barcode, DMC or serial. Decade-long traceability. Automated backups.

In the system

Here is what it looks like.

Process capability straight from the test software.

Cm/Cmk, Pp/Ppk and Cp/Cpk come out of the running test data – with no export into a second system.

Above a Cpk of 1.33 a process counts as capable. The evaluation shows position, spread and limits in one view and filters straight through to the parts concerned.

SonicTC process capability Cpk and statistical process control evaluation
In detail

Statistics and quality management that run alongside.

SonicTC history with result list, histogram including normal distribution curve, box-whisker plot and Q-Q chart

Measurement system analysis

Cg, Cgk and Gage R&R check the measurement system first – without a capable gauge, any process control is worthless.

Process capability

Cm/Cmk for the machine, Pp/Ppk for pre-series, Cp/Cpk for the running process – each with guidance on how to read it.

Data distribution

Histogram, box-whisker plot and Q-Q chart show whether the assumption of a normal distribution holds at all.

Control charts

The X-MR chart separates individual value and moving range – process position and process spread get judged separately.

Pareto analysis

Roughly 80 % of defects come from 20 % of causes. The filter leads from the bar straight to the parts concerned.

Defect analysis

The Laney p′ chart corrects over- and under-dispersion and avoids false alarms with large sample sizes.

Correlation analysis

The Pearson coefficient from −1 to +1 reveals relationships between characteristics – correlation explicitly remains no causation.

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